Scanning probe microscope (SPM) is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen. Examples for SPM: AFM, STM, MFM, KPFM, NSNOM,SSRM, SThM, contact AFM, tapping mode AFM.

AFM scan 3D

AFM Topography

Quantitative height analysis with sub-nanometer resolution with…

Conductive AFM in SEM using Solid Platinum Tips

For conductive CL visit https://www.c-sense.at/  

Nanoindentation analysis with AFSEM®

Observe the indentation by SEM, measure it with AFSEM® SEM…