Latest publication – SCL cantilevers used for AFM in-situ SEM
Our partner company GETec Microscopy and Nanosurf have published a new paper via Microscopy and Analysis 31(2): p14-18.
The AFSEM™ from Nanosurf/GETec provides a powerful new capability that joins the forces of AFM and SEM. AFM imaging in all the conventional AFM modes is now possible simultaneously under a SEM beam without disruption to either technique. Through its unique design and the use of 
SCL self-sensing cantilevers, the unit is the first cross-platform AFM that can be integrated into all major commercial SEMs.
