Piezo‐Resistive Sensing (PRS) probes are silicon cantilevers with a long‐life single crystal diamond tip (SCD). Integrated piezoresistors are used for self‐sensing the cantilever deflection. The piezo‐resistors are integrated into a matched Wheatstone bridge to raise the sensitivity and compensate environmental thermal drift.
Self‐sensing readout technology makes laser adjustment obsolete and saves time during a cantilever change. The free space above the cantilever enables new applications and combination of AFM with various instruments. The SCD tip exhibits low surface energy, which prevents contamination when imaging sticky or biological samples.
The cantilever chip is bonded to a small printed circuit board (PCB) with a small connector to enable a quick cantilever change. A counter part PCB for the cantilever PCB can be connected to a low‐noise preamplifier with a flat flex cable.