SCL at the MRS Fall Meeting in Boston, USA

SCL-Sensor.Tech. presented its self-sensing cantilevers at the MRS Fall Meeting exhibition in Boston (USA). In addition, Dr. Christian Schwalb presented latest results for the self-sensing cantilever in “Correlated AFM & SEM Microscopy of Nanostructured Materials” in combination with Opens external link in new windowAFSEMTM to leading scientists in the course of the Symposium “Frontiers in Scanning Probe Microscopy”.

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